editorinchief@ijrtmr.com +91 9840521421 Scholarly Open Access, Peer-reviewed, Refereed Journal e-ISSN 2583-0368 Since 2021
  1. Home
  2. Archives
  3. 2023
  4. Vol. 3 Issue 5
  5. Article
Research Article

Scan Chain Dependent Approaching Technique towards Fault Recovery

  • Paper ID 71
  • Volume 3, Issue 5
  • Pages 17-20
  • Published Online: September-October 2023
  • 6 Views
Open Access Peer Reviewed

Authors

  • Ramakrishna Reddy Kareti1
  • Rajesh Nandalike2

12 Department of Electronics and Communication Engineering, JAIN College of Engineering, Karnataka, India.

Article Information

DOI
No DOI
Published Online
September-October 2023
Pages
17-20
Article Type
Research Article
Check for updates
No DOI available for cross-reference

References

1. P.K.Samudrala,J.Ramos, and S.Katkoori,(2004) “Selective triple modularred undancy(STMR)based single-eventupset(SEU) to lerant
synthes is forFPGAs,”IEEETrans.Nucl.Sci.,vol.51,no.5,pp.2957–2969
2. S.D’Angelo,C.Metra,andG.Sechi,(1999)“Transient and permanent fault diagnos is for FPGA-based TMR
systems,”inProc.Int.Symp.Defect
3. Fault Tolerance VLSISyst,pp. 330–338.
4. Omar Hiari, Waseem Sadeh, and Osamah Rawashdeh(2012),“Towards Single Chip Diversity TMR for Automotive Applications,”
Volume: 43 , Issue:6,Page(s):2742–2750.
5. J.A.Abraham and D.P.Siewiorek,(1974) “An algorithm for the accurate reliability evaluation of triple modular redundancy
networks,”IEEETrans.
6. Comput.,vol.23,no.7,pp.682–692
7. I. Koren and S. Y. H. Su(1979), “Reliability analysis of N-modular redundancy systems with intermittent and permanent faults,”
IEEE Trans. Comput.,vol.28,no.7,pp.514–520,Jul.
8. M.Zhang,S.Mitra,T.M.Mak,N.Seifert,N.J.Wang,Q.Shi,K.S.Kim,N.R.Shanbhag,andS.J.Patel,(2006)“Sequentialele mentdesign with
built-insofterror resilience,”IEEE Trans. Very Large Scale Integr.(VLSI)Syst.,vol.14,no.12,pp.1368–1378
9. F.L.Kastensmidt,L.Sterpone,L.Carro,andM.S.Reorda.,(2005)“OntheoptimaldesignoftriplemodularredundancylogicforSRAM-
basedFPGAs,”inProc.DesignAutom.TestEur.Conf.Exhibit,pp.1530–159
10. FirozAhmedSiddiqui,PuranGur(2014)“Scan-Chain-BasedMultipleErrorRecoveryinTMRSystems(SMERTMR):AReview”ISSN:2349-
4689Volume-02
APC from ₹1200 + 18% GST

Peer-reviewed open access₹1200 Indian (₹1400 with DOI)$80 USD internationalpaid after acceptance Peer-reviewed open access₹1200 Indian$80 USD international ₹1200 Indian · $80 intl

  • CrossRef DOI
  • ISSN 2583-0368
  • Open Access
  • Peer Reviewed
  • Plagiarism Checked
  • Google Scholar
Submit Paper